• Title of article

    Direct multielement trace analyses of silicon carbide powders by spark ablation simultaneous inductively coupled plasma optical emission spectrometry

  • Author/Authors

    Kiera، نويسنده , , Arne F. and Schmidt-Lehr، نويسنده , , Sebastian and Song، نويسنده , , Ming and Bings، نويسنده , , Nicolas H. and Broekaert، نويسنده , , José A.C.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    6
  • From page
    287
  • To page
    292
  • Abstract
    A procedure for the direct analysis of silicon carbide powders (SiC) by simultaneous detection inductively coupled plasma optical emission spectrometry using a Spectro-CIROS™ spectrometer (CCD-ICP-OES) and a novel spark ablation system Spectro-SASSy (SA) as sample introduction technique is described. The sample preparation procedure for SA of non-conducting material is based on mixing the sample powders with a conducting matrix, in this case copper and briquetting pellets. Pressing time, pressure and mixing ratio are shown to be important parameters of the pelleting technique with respect to their mechanical stability for the reliability of the analysis results. A mixing ratio of 0.2 g +0.6 g for SiC and Cu, a pressure of 10 t cm− 2 and a pressing time of 8 min have been found optimum. It has also been shown that the spark parameters selected are crucial for uniform volatilization. Electron probe micrographs of the burning spots and the analytical signal magnitude showed that a rather hard spark at 100 Hz was optimum. The determination of trace elements in silicon carbide powders is demonstrated using a calibration based on the addition of standard solutions. For Al, Ti, V, Mn and Fe detection limits in the lower µg g− 1 range can be achieved. Internal standardization with Y in combination with the addition of standard solutions allows relative standard deviations in the range of 4 to 24% for concentration levels of the order of 3 to 350 µg g− 1.
  • Keywords
    Spark ablation , Inductively coupled plasma optical emission spectrometry , SA-ICP-OES , silicon carbide
  • Journal title
    Spectrochimica Acta Part B Atomic Spectroscopy
  • Serial Year
    2008
  • Journal title
    Spectrochimica Acta Part B Atomic Spectroscopy
  • Record number

    1682198