Title of article :
The influence of X-ray resonant Raman scattering effects on the detection of copper(II) tetrasulphonated phthalocyanine (CuTSPc) thin-films deposited on gold electrodes
Author/Authors :
Peeters، نويسنده , , Karl and De Wael، نويسنده , , Karolien and Adriaens، نويسنده , , Annemie and Falkenberg، نويسنده , , Gerald and Vincze، نويسنده , , Laszlo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
450
To page :
454
Abstract :
The influence of X-ray resonant Raman scattering on the detection capabilities of copper(II) tetrasulphonated phthalocyanine (CuTSPc) thin-films on gold electrodes has been investigated by means of synchrotron radiation X-ray fluorescence. In particular the paper focuses on the influence of the excitation energy in the relative narrow energy region of 9.2 to 11.7 keV on the detection limits and the peak-to-background ratios of copper.
Keywords :
X-ray resonant Raman scattering (XRRS) , Copper(II) tetrasulphonated phthalocyanine (CuTSPc) , detection limit , Gold electrode , Synchrotron radiation X-ray fluorescence (XRF)
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Serial Year :
2008
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Record number :
1682238
Link To Document :
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