Author/Authors :
Berényi، نويسنده , , Z. and Aszal?s-Kiss، نويسنده , , B. and T?th، نويسنده , , J. B. Varga and K. M. Hangos، نويسنده , , D. and K?vér، نويسنده , , L. and T?kési، نويسنده , , K. and Cserny، نويسنده , , I. and Tanuma، نويسنده , , S.، نويسنده ,
Abstract :
Elastic-peak electron spectra were recorded in the range of 2–10 keV primary electron energy in order to determine the inelastic mean free path (IMFP) of electrons in polycrystalline Ge samples using Ag as a reference material. The IMFPs of the studied material were calculated as functions of the reference IMFPs to examine the effects of different sources of errors on the accuracy of the resulting data. This representation gives the opportunity to easily re-determine IMFPs for any Ag reference data as well.
Keywords :
Germanium , Polycrystalline surfaces , Electron–solid interactions , scattering , Electron–solid scattering and transmission – elastic , Reflection spectroscopy , Diffraction
