Title of article :
Resonant photoemission from Si(0 0 1)
Author/Authors :
Chen، نويسنده , , Gang and Ding، نويسنده , , Xunmin and Wang، نويسنده , , Xun and Li، نويسنده , , Zheshen، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Pages :
4
From page :
137
To page :
140
Abstract :
The evolution of the silicon valence-band photoemission spectra is observed in the photon energy range from the threshold of Si 2p core-level excitation to about 50 eV above this threshold. Besides the Si 3s3p- and 3p-like features in the spectra, there exhibits a new peak which is significantly enhanced while the photon energy is in the neighborhood of 20 eV above the Si 2p core-level excitation threshold. This phenomenon is suggested to be a resonant photoemission caused by the interference between the primary photoexcitation of 3s3p and its autoionization due to direct recombination of the 2p3d excitation.
Keywords :
Silicon , Photoemission (total yield)
Journal title :
Surface Science
Serial Year :
2003
Journal title :
Surface Science
Record number :
1682796
Link To Document :
بازگشت