• Title of article

    Regular step formation on concave-shaped surfaces on 6H–SiC(0 0 0 1)

  • Author/Authors

    Wulfhekel، نويسنده , , Wulf and Sander، نويسنده , , Dirk and Nitsche، نويسنده , , Serge and Dulot، نويسنده , , Frédéric and Leycuras، نويسنده , , André and Hanbücken، نويسنده , , Margrit، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2004
  • Pages
    7
  • From page
    8
  • To page
    14
  • Abstract
    A concave-shaped surface has been prepared in a 6H–SiC(0 0 0 1) substrate by mechanical grinding. As a consequence, the different crystallographic planes building up the 6H–SiC polytype are cut under continuously changing polar angles in all azimuthal directions. Through hydrogen etching, this curved surface breaks up into a whole set of surfaces vicinal to the initial 6H(0 0 0 1) orientation. The local structural reorganisation after hydrogen etching has been studied by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Two types of local bond environments are present at the step edges leading to a strong anisotropy in the surface etching with hydrogen. As a result, the distribution of the terrace width and the step heights varies with the azimuthal angle and reflects the sixfold symmetry of the bulk crystal. For most azimuthal directions, an alternation of large and small terraces, separated by steps of 0.75 nm heights (height of half the 6H polytype, three bilayers) is observed and only for well defined azimuthal directions, equally spaced terraces separated by steps of 1.5 nm height (one unit cell of 6H–SiC, six bilayers) are found. In addition, the polar variations have been studied by taking various line-scans along the concave-shaped surface with AFM. It seems that for polar angles above 3°, step bunching of several SiC steps occurs whereas below 3° the bimodal terrace width distribution is observed.
  • Keywords
    Curved surfaces , and topography , surface structure , atomic force microscopy , Hydrogen molecule , Scanning electron microscopy (SEM) , silicon carbide , morphology , Roughness , Etching
  • Journal title
    Surface Science
  • Serial Year
    2004
  • Journal title
    Surface Science
  • Record number

    1684216