Title of article :
DFT calculation of the stability and mobility of noble gas atoms in silicon
Author/Authors :
Charaf Eddin، نويسنده , , A. and Lucas، نويسنده , , G. and Beaufort، نويسنده , , M.F. and Pizzagalli، نويسنده , , L.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
1030
To page :
1033
Abstract :
We have investigated the stability and the migration of single noble gas atoms (He, Ne, Ar, Kr) in bulk silicon, by performing first-principles calculations. Our results indicate that all noble gas interstitials were found to be preferentially located in a tetrahedral site. Other possible sites have been studied too, like the hexagonal one which becomes unstable for large noble gas atoms such as Ar and Kr. Using nudged elastic band technique, we have determined the minimum energy path, and the associated migration energies. Our results are discussed and compared to other works.
Keywords :
Noble gas , Density functional theory , Silicon , diffusion
Journal title :
Computational Materials Science
Serial Year :
2009
Journal title :
Computational Materials Science
Record number :
1684254
Link To Document :
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