Title of article :
Well-ordered ultra-thin Al2O3 film formation on NiAl(1 1 0) by high-temperature oxidation
Author/Authors :
Yoshitake، نويسنده , , Michiko and Lay، نويسنده , , ThiThi and Song، نويسنده , , Weijie، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Pages :
7
From page :
211
To page :
217
Abstract :
NiAl(1 1 0) was oxidized at high temperature in an ultra-high vacuum. To examine the range of oxidation condition for a well-ordered ultra-thin Al2O3 film formation, oxidation was carried out at 970, 1070, and 1100 K by exposing the specimen to 1200 L oxygen under partial oxygen pressures of 6.6 × 10−5 and 6.6 × 10−6 Pa. LEED observation revealed that a crystalline Al2O3 formed at 1070 K under 6.6 × 10−6 Pa oxygen was best ordered among the present experimental conditions.
Keywords :
Aluminum oxide , crystallization , Low energy electron diffraction (LEED) , Oxidation , X-ray photoelectron spectroscopy
Journal title :
Surface Science
Serial Year :
2004
Journal title :
Surface Science
Record number :
1684836
Link To Document :
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