Title of article :
Phase separation of PS/PVME blend films induced by capillary force
Author/Authors :
Li، نويسنده , , Xue and Wang، نويسنده , , Zhe and Cui، نويسنده , , Liang and Xing، نويسنده , , Rubo and Han، نويسنده , , Yanchun and An، نويسنده , , Lijia، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Pages :
9
From page :
12
To page :
20
Abstract :
The phase behavior of a miscible PS/PVME (80/20, w/w) blend film in a confined geometry has been investigated at the annealing temperature much lower than the low critical solution temperature (LCST) of the blend. When the annealing temperature (52 °C) is near the glass transition temperature of the blend (51.2 °C), PVME-rich phase at the air–film surface under a microchannel forms smaller protrusion. When the annealing temperature is increased to 70 °C, the protruding stripes, which are almost developed, are mainly composed of the mobile PVME-rich phase. These results reveal that the capillary force lead to the enrichment of PVME-rich phase at the air–polymer interface of a PDMS microchannel, that is, the capillary force lithography (CFL) can induce the phase separation of PS/PVME blend films.
Keywords :
Polycrystalline thin films , atomic force microscopy , X-ray photoelectron spectroscopy
Journal title :
Surface Science
Serial Year :
2004
Journal title :
Surface Science
Record number :
1684903
Link To Document :
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