Title of article :
LEEM study of island decay on Si(1 1 0)
Author/Authors :
Watanabe، نويسنده , , Fumiya and Kodambaka، نويسنده , , S. and Swiech، نويسنده , , Waclaw and Greene، نويسنده , , J.E. and Cahill، نويسنده , , David G.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Abstract :
Laser texturing enables the observation of island decays on the ‘1 × 1’ high temperature surface of Si(1 1 0) by low energy electron microscopy. At temperatures above the phase transition (T = 790–980 °C), the decay of the island areas exhibits a nonlinear dependence on time indicative of surface diffusion limited mass transport. The aspect ratios of the islands during the decay show a weak temperature dependence despite the fact that surface is anisotropic. We have obtained the activation energy of mass transport, the kink energy, step energy, and step stiffness for Si(1 1 0).
Keywords :
Silicon , Low-energy electron microscopy (LEEM) , surface diffusion , laser methods
Journal title :
Surface Science
Journal title :
Surface Science