Title of article
A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN
Author/Authors
Daniels، نويسنده , , B.G. and Schedin، نويسنده , , F. and Bikondoa، نويسنده , , O. and Thornton، نويسنده , , G. and Lindsay، نويسنده , , R.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
6
From page
433
To page
438
Abstract
Surface X-ray diffraction (SXRD) has been employed to elucidate the geometry of Ni(1 1 0)c(2 × 2)-CN. It is concluded that the CN overlayer induces an expansion of the outermost Ni layer spacing of 11 ± 2%, relative to bulk-termination. In contrast to an earlier hypothesis, however, no substantive evidence for a significant substrate reconstruction is found. These results are in accord with previously published quantitative structure determinations of this system.
Keywords
X-Ray scattering , Chemisorption , Surface relaxation and reconstruction , nickel , CYANOGEN , Low index single crystal surfaces , Diffraction , and reflection
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1684953
Link To Document