A surface X-ray diffraction study of Ni(1 1 0)c(2 × 2)-CN

Surface X-ray diffraction (SXRD) has been employed to elucidate the geometry of Ni(1 1 0)c(2 × 2)-CN. It is concluded that the CN overlayer induces an expansion of the outermost Ni layer spacing of 11 ± 2%, relative to bulk-termination. In contrast to an earlier hypothesis, however, no substantive evidence for a significant substrate reconstruction is found. These results are in accord with previously published quantitative structure determinations of this system.