Title of article :
Growth of atomically flat Ag on mica
Author/Authors :
Dumont، نويسنده , , J. and Wiame، نويسنده , , F. and Ghijsen، نويسنده , , J. and Sporken، نويسنده , , R.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Abstract :
We investigated, by Scanning Tunneling Microscopy, the influence of the deposition rate on the morphology of Ag films grown on mica heated around 475 K. An explanation of growth morphologies based on mean-field nucleation theory and on the theory of Tersoff, Denier and Tromp is proposed. Two-dimensional growth is obtained if the Ag flux is adjusted in a way that reduces the difference between the diffusion lengths of Ag on Ag and of Ag on mica: it helps to minimise the density of islands in order to avoid the piling-up that arises from a high step-edge diffusion barrier. This is achieved by keeping the substrate around 475 K during deposition.
Keywords :
surface structure , Metallic films , and topography , Mica , morphology , Roughness , silver , epitaxy , Scanning tunneling microscopy
Journal title :
Surface Science
Journal title :
Surface Science