Title of article :
On analyzing the intrinsic processes through the Shirley background correction procedure
Author/Authors :
Végh، نويسنده , , Jلnos، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2005
Pages :
9
From page :
220
To page :
228
Abstract :
The process of creating photoelectrons in solids is strongly connected to different kinds of energy loss processes, classified as ‘extrinsic’ and ‘intrinsic’. In measured spectra the peaks are sensitively affected by all these processes. Of course one tries to extract from the spectrum shape as much information on these processes as possible. Unfortunately, the different loss processes are inextricably mixed. In theoretical works it is of course possible to consider these contributions separately, so some authors try to derive these contributions from the experimental spectra, too. The task is hard and the methods used for this goal are not always appropriate. Some popular methods are clearly based on misunderstanding or misusing the popular Shirley background correction method. This work explores the origin of some such problems and explains why those results (like density of states, intrinsic background, inelastic shape, etc.) based on inappropriately used methods are unreliable.
Keywords :
Shirley method , energy loss , Inelastic electron scattering , Intrinsic contribution , Inelastic background correction
Journal title :
Surface Science
Serial Year :
2005
Journal title :
Surface Science
Record number :
1685051
Link To Document :
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