Title of article
Samarium-induced surface reconstructions of Si(0 0 1)
Author/Authors
Ohbuchi، نويسنده , , C. and Nogami، نويسنده , , J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2005
Pages
9
From page
157
To page
165
Abstract
The growth of Sm on Si(0 0 1) at 600 °C was studied by scanning tunneling microscopy. There are two different surface reconstructions: a lower coverage 2 × 3 phase and a higher coverage 3 × 2 phase. Sm zigzag chain structures coexist with the 2 × 3 structure at low coverage. The 3 × 2 phase coexists with a related c(6 × 2) phase. At higher coverages, large 3D Sm silicide islands are found.
Keywords
Scanning tunneling microscopy , surface structure , morphology , and topography , Roughness , Silicon , Samarium , silicide , Surface relaxation and reconstruction
Journal title
Surface Science
Serial Year
2005
Journal title
Surface Science
Record number
1685086
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