Title of article :
Growth of thin platinum films on Cu(1 0 0): CAICISS, XPS and LEED studies
Author/Authors :
Walker، نويسنده , , M. and Parkinson، نويسنده , , C.R. and Draxler، نويسنده , , M. and McConville، نويسنده , , C.F.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2005
Pages :
8
From page :
153
To page :
160
Abstract :
The growth mode of platinum films on the Cu(1 0 0) surface up to a coverage of 2.75 ML has been studied using co-axial impact collision ion scattering spectroscopy (CAICISS), X-ray photoelectron spectroscopy and low energy electron diffraction. CAICISS data show the formation of a Cu–Pt alloy at room temperature in the top three atomic layers at sub-monolayer Pt coverage. As the coverage increases up to 2.75 ML the formation of a Pt overlayer is observed in conjunction with the near surface region becoming Pt-rich, indicating the onset of layer-by-layer growth. Subsequent annealing shows a significant migration of Pt into the bulk Cu at a temperature of 300 °C. Evidence for a more ordered surface after annealing is also presented.
Keywords :
Alloys , Copper , Low energy ion scattering (LEIS) , Low energy electron diffraction (LEED) , X-ray photoelectron spectroscopy , Platinum
Journal title :
Surface Science
Serial Year :
2005
Journal title :
Surface Science
Record number :
1685184
Link To Document :
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