Title of article :
Size of small Si and Ge clusters on Si(1 1 1) and Ge(1 1 1) surfaces
Author/Authors :
Asaoka، نويسنده , , Hidehito and Cherepanov، نويسنده , , Vasily and Voigtlنnder، نويسنده , , Bert، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2005
Pages :
7
From page :
19
To page :
25
Abstract :
We determined the average size of small Si and Ge clusters confined to one half of a (7 × 7) or (5 × 5) unit cell of a Si or Ge(1 1 1) surface. The growth conditions were chosen in order to produce clusters with the size close to their maximal size. The size of Si and Ge clusters confined to a Si(1 1 1)-(7 × 7) half unit cell was determined to be 8.3 ± 1 atoms and 7.5 ± 1 atoms, respectively for a growth temperature of 400 K. This is the same value within the error and shows that the material of the clusters is less important for the cluster size. On the Ge surface it was found that the reconstruction unit cell is important for the cluster size. On the (5 × 5) reconstructed Ge(1 1 1) surface the Si clusters have a smaller size of 4.7 ± 1 atoms compared to 8.2 ± 1 atoms on the Ge(1 1 1)-(7 × 7) surface.
Keywords :
Scanning tunneling microscopy , SELF-ASSEMBLY , surface reconstruction , Germanium , Silicon , Molecular Beam Epitaxy , Clusters
Journal title :
Surface Science
Serial Year :
2005
Journal title :
Surface Science
Record number :
1685255
Link To Document :
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