• Title of article

    Formation of Sb submonolayer phases on high index Si(5 5 12) surface

  • Author/Authors

    Kumar، نويسنده , , Mahesh and Paliwal، نويسنده , , Vinod Kumar and Joshi، نويسنده , , Amish G. and Govind and Shivaprasad، نويسنده , , S.M.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2005
  • Pages
    6
  • From page
    206
  • To page
    211
  • Abstract
    This work is the first report on the submonolayer adsorption of antimony (Sb) on the high index Si(5 5 12) surface, studied in UHV by in situ surface sensitive probes such as Auger electron spectroscopy (AES), electron energy loss spectroscopy (EELS), and low energy electron diffraction (LEED). The Auger growth curve which is a plot of the Sb(MNN)/Si(LVV) Auger peak intensity ratio with deposition time, provides a calibration of a deposition rate of 0.06 ML/min. A coverage of 0.2 ML is obtained by four different routes (a) adsorption at room temperature (RT), (b) adsorption at high substrate temperature (HT) of 680 °C, (c) annealing the RT adsorbed surface to 800 °C and (d) annealing the high substrate temperature (680 °C) adsorbed surface to 800 °C. The (2 2 5) facets are observed for the RT adsorbed system at coverage of 0.2 ML, while the pathway adopted to attain the 0.2 ML coverage by adsorption at elevated temperature shows two different atomic arrangements in the formation of the (3 3 7) facets. The HT adsorbed surface suggests the formation of nano-wire-like features while the 0.2 ML coverage obtained by annealing the HT as well as RT adsorbed surface suggests an anisotropic Sb atomic arrangement.
  • Keywords
    Si(5  , Antimony , 12) , High index surfaces , Low energy electron diffraction , epitaxy , Auger electron spectroscopy , Electron Energy Loss Spectroscopy , 5  , Metal–semiconductor interfaces
  • Journal title
    Surface Science
  • Serial Year
    2005
  • Journal title
    Surface Science
  • Record number

    1685469