• Title of article

    Preparation and characterization of well-ordered, thin niobia films on a metal substrate

  • Author/Authors

    Starr، نويسنده , , D.E. and Mendes، نويسنده , , F.M.T. and Middeke، نويسنده , , J. D. Blum، نويسنده , , R.-P. and Niehus، نويسنده , , H. and Lahav، نويسنده , , Martin D. and Guimond، نويسنده , , S. and Uhl، نويسنده , , A. and Kluener، نويسنده , , T. and Schmal، نويسنده , , M. and Kuhlenbeck، نويسنده , , H. and Shaikhutdinov، نويسنده , , S. and Freund، نويسنده , , H.-J.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2005
  • Pages
    13
  • From page
    14
  • To page
    26
  • Abstract
    Combining low energy electron diffraction, scanning tunneling microscopy, angular resolved photoelectron spectroscopy using synchrotron radiation and density functional theory calculations, we have studied the structure of thin niobia films grown on a Cu3Au(1 0 0) substrate. Nb deposition onto oxygen implanted Cu3Au(1 0 0) and subsequent oxidation results in a flat, well-ordered thin niobia film of hexagonal symmetry. The results suggest that the film consists of 2/3 ML of Nb between two hexagonal O-layers, where Nb5+ cations occupy the threefold hollow sites. This leads to a ( 3 × 3 ) R30° structure with respect to the underlying close packed O layer, which in turn forms a (2 × 7) coincidence structure with the metal substrate. The defect structure includes reflection domain boundaries and vacancies.
  • Keywords
    Photoelectron spectroscopy , Density functional theory , Thin oxide films , epitaxy , Niobia , Scanning tunneling microscopy
  • Journal title
    Surface Science
  • Serial Year
    2005
  • Journal title
    Surface Science
  • Record number

    1685525