Title of article
Preparation and characterization of well-ordered, thin niobia films on a metal substrate
Author/Authors
Starr، نويسنده , , D.E. and Mendes، نويسنده , , F.M.T. and Middeke، نويسنده , , J. D. Blum، نويسنده , , R.-P. and Niehus، نويسنده , , H. and Lahav، نويسنده , , Martin D. and Guimond، نويسنده , , S. and Uhl، نويسنده , , A. and Kluener، نويسنده , , T. and Schmal، نويسنده , , M. and Kuhlenbeck، نويسنده , , H. and Shaikhutdinov، نويسنده , , S. and Freund، نويسنده , , H.-J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2005
Pages
13
From page
14
To page
26
Abstract
Combining low energy electron diffraction, scanning tunneling microscopy, angular resolved photoelectron spectroscopy using synchrotron radiation and density functional theory calculations, we have studied the structure of thin niobia films grown on a Cu3Au(1 0 0) substrate. Nb deposition onto oxygen implanted Cu3Au(1 0 0) and subsequent oxidation results in a flat, well-ordered thin niobia film of hexagonal symmetry. The results suggest that the film consists of 2/3 ML of Nb between two hexagonal O-layers, where Nb5+ cations occupy the threefold hollow sites. This leads to a ( 3 × 3 ) R30° structure with respect to the underlying close packed O layer, which in turn forms a (2 × 7) coincidence structure with the metal substrate. The defect structure includes reflection domain boundaries and vacancies.
Keywords
Photoelectron spectroscopy , Density functional theory , Thin oxide films , epitaxy , Niobia , Scanning tunneling microscopy
Journal title
Surface Science
Serial Year
2005
Journal title
Surface Science
Record number
1685525
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