Title of article
Interaction of Ag with the Si(1 1 1)1 × 1–H surface
Author/Authors
Han، نويسنده , , J.-H. and Hwang، نويسنده , , H.-N. and Jee، نويسنده , , H.-G. and Kim، نويسنده , , B. K. Chung، نويسنده , , S. and Kim، نويسنده , , Y.D. and Hwang، نويسنده , , C.-C.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2010
Pages
4
From page
853
To page
856
Abstract
Synchrotron radiation based photoemission spectroscopy (SRPES) and low energy electron diffraction (LEED) are used to study the interaction between Ag atoms and the Si(1 1 1)1 × 1–H surface. At an Ag coverage of 0.063 monolayers (ML) on the Si(1 1 1)1 × 1–H surface, the Si 2p component corresponding to Si–H bonds decreases, and an additional Si 2p component appears which shifts to a lower binding energy by 109 meV with respect to the Si bulk peak. The new Si 2p component is also observed for 0.25 ML Ag on the Si(1 1 1)7 × 7 surface. These findings suggest that Ag atoms replace the H atoms of the Si(1 1 1)1 × 1–H surface and form direct Ag–Si bonds. Contrary to the widely accepted view that there is no chemical interaction between Ag particles and the H-passivated Si surface, these results are in good agreement with recent first-principles calculations.
Keywords
1 , 1)1 , × , 1–H surface , Ag–Si bonds , Synchrotron radiation based photoemission spectroscopy , Silver atoms , Low energy electron diffraction , Si(1
Journal title
Surface Science
Serial Year
2010
Journal title
Surface Science
Record number
1685720
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