• Title of article

    Interaction of Ag with the Si(1 1 1)1 × 1–H surface

  • Author/Authors

    Han، نويسنده , , J.-H. and Hwang، نويسنده , , H.-N. and Jee، نويسنده , , H.-G. and Kim، نويسنده , , B. K. Chung، نويسنده , , S. and Kim، نويسنده , , Y.D. and Hwang، نويسنده , , C.-C.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2010
  • Pages
    4
  • From page
    853
  • To page
    856
  • Abstract
    Synchrotron radiation based photoemission spectroscopy (SRPES) and low energy electron diffraction (LEED) are used to study the interaction between Ag atoms and the Si(1 1 1)1 × 1–H surface. At an Ag coverage of 0.063 monolayers (ML) on the Si(1 1 1)1 × 1–H surface, the Si 2p component corresponding to Si–H bonds decreases, and an additional Si 2p component appears which shifts to a lower binding energy by 109 meV with respect to the Si bulk peak. The new Si 2p component is also observed for 0.25 ML Ag on the Si(1 1 1)7 × 7 surface. These findings suggest that Ag atoms replace the H atoms of the Si(1 1 1)1 × 1–H surface and form direct Ag–Si bonds. Contrary to the widely accepted view that there is no chemical interaction between Ag particles and the H-passivated Si surface, these results are in good agreement with recent first-principles calculations.
  • Keywords
    1  , 1)1  , ×  , 1–H surface , Ag–Si bonds , Synchrotron radiation based photoemission spectroscopy , Silver atoms , Low energy electron diffraction , Si(1 
  • Journal title
    Surface Science
  • Serial Year
    2010
  • Journal title
    Surface Science
  • Record number

    1685720