Author/Authors :
Weier، نويسنده , , D. and Lühr، نويسنده , , T. and Beimborn، نويسنده , , A. and Schِnbohm، نويسنده , , F. and Dِring، نويسنده , , S. and Berges، نويسنده , , U. and Westphal، نويسنده , , C.، نويسنده ,
Abstract :
The chemical and geometrical properties of the system pyridine on Si(100) are investigated in a combined photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) study. Synchrotron radiation was applied to achieve high spectral resolution and a high surface sensitivity. Our studies were performed at saturation coverage of pyridine on silicon. The XPS and XPD results, including diffraction patterns for all spectral resolved components, clearly show that pyridine is reacting with silicon dimer atoms of the (2 × 1)-reconstructed surface. We propose a tetra-σ-bonded structure model and provide detailed structure parameters.
Keywords :
pyridine , Organic–semiconductor interface , Photoelectron spectroscopy , Photoelectron diffraction , Silicon
