Author/Authors :
Vecchione، نويسنده , , A. and Fittipaldi، نويسنده , , R. and Cirillo، نويسنده , , C. and Hesselberth، نويسنده , , M. and Aarts، نويسنده , , J. and Prischepa، نويسنده , , S.L. and Kushnir، نويسنده , , V.N. and Kupriyanov، نويسنده , , M.Yu. and Attanasio، نويسنده , , C.، نويسنده ,
Abstract :
Specular and diffuse X-ray scattering are used to study interfacial roughness in Nb/Pd0.81Ni0.19 multilayers deposited by dc UHV sputtering. The data are analyzed to extract information about the correlated behavior of interface roughness in both the lateral and vertical directions. X-ray reflectivity is treated quantitatively by computer-aided simulation and modelling in order to extract values also for the layers thickness. From the analysis of the diffusive spectra of the reflectivity maps the roughness correlation has been evaluated.
Keywords :
Interfacial roughness , Metallic multilayers , Diffuse X-ray scattering , X-ray reflectivity , Correlated roughness , Specular X-ray scattering , Superconductivity , Ferromagnetism
