Fluctuations of electroluminescence intensity of single CdSe nanocrystals excited by scanning tunneling microscope current

Electroluminescence from single CdSe nanocrystals (NCs) excited by tunneling current of scanning tunneling microscope (STM) has been measured. Two types of samples with low and high concentration of CdSe NCs deposited on the gold substrate have been prepared. Both types of samples had no plasmon emission. It enabled one to detect pure electroluminescence from single CdSe NCs. Samples with low concentration of NCs exhibit an intensive short-term luminescence of NCs for several seconds. Samples with high concentration of NCs exhibit a weak fluctuating long-term luminescence for thousand seconds. Fluctuations of NC electroluminescence differ considerably from those detected recently in photoluminescence of CdSe NCs embedded in polymer films. The difference in fluctuations results from the difference in physical conditions existing in electro- and photoluminescence. The distribution of photons w(N, T) emitted in time interval T has been found from statistical treating of fluctuating luminescence. Due to weakness of the pure signal, we paid a special attention to allowing for photomultiplier tube noise while treating these fluctuations. The photon distribution in pure signal is one of super-Poisson type, i.e. it is broader than Poisson distribution. A dynamical model for an absorber–emitter excited by tunneling current of STM has been offered. The model takes into account the thermal drift of STM tip.