Title of article
Structural reorientation of PLD grown La2NiO4 thin films
Author/Authors
Telesca، نويسنده , , D. and Wells، نويسنده , , B.O. and Sinkovic، نويسنده , , B.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2012
Pages
7
From page
865
To page
871
Abstract
Single crystal La2NiO4 films were grown on STO (001) substrates by use of pulsed laser deposition (PLD). It was found that these films grow with the c-axis in the out of plane direction up to a certain critical thickness. Films thicker than that resulted in a structural reorientation from c-axis to a-axis out of plane orientation. The evolution of the c and a axis were measured by using a four circle X-ray diffractometer.
Keywords
La2NiO4 , Thin films , Structural reorientation , X-ray diffraction , pulsed laser deposition
Journal title
Surface Science
Serial Year
2012
Journal title
Surface Science
Record number
1686445
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