Determination of X-ray compression efficiency of a thin film X-ray waveguide structure using marker layer fluorescence

We demonstrate that a thin marker layer, sandwiched in the guiding medium of a thin film planner X-ray waveguide structure, can be used to determine X-ray compression efficiency for a particular excitation mode. It can also be used in evaluating the transmission efficiency of waveguide structure and for the determination of X-ray intensities reaching the waveguide exit. This approach has been applied for determining X-ray compression and transmission efficiency of a Mo/B4C/Mo based X-ray waveguide structure, by inserting a thin Fe marker layer.