Title of article :
Triple-period partial misfit dislocations at the InN/GaN (0001) interface: A new dislocation core structure for III-N materials
Author/Authors :
Zhang، نويسنده , , Lixin and McMahon، نويسنده , , W.E. and Liu، نويسنده , , Y. and Cai، نويسنده , , Y. and Xie، نويسنده , , M.H. and Wang، نويسنده , , N. and Zhang، نويسنده , , S.B.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2012
Pages :
11
From page :
1728
To page :
1738
Abstract :
The lattice-misfit InN/GaN (0001) interface supports a triangular network of α-core 90° partial misfit dislocations. These misfit dislocations provide excellent strain relief. However, in their unreconstructed form the dislocation contains numerous high-energy N dangling bonds, which must be eliminated by reconstructing the dislocation core. Existing single-period (SP) and double-period (DP) dislocation reconstruction models eliminate these dangling bonds via a like-atom dimerization, such as N-N dimers. However, we show that these N–N dimers are unstable for the III-N materials, so an entirely new reconstruction mechanism is needed. A “triple-period” (TP) structural model is developed which eliminates N dangling bonds via the formation of N vacancies instead of N-N dimers. The model contains no N–N (or III–III) bonds, fully bonds all N atoms to four group-III neighboring atoms, and satisfies the “electron counting rule” by transferring charge from In dangling bonds to Ga dangling bonds.
Keywords :
reconstruction , InN/GaN(111) , Ab initio calculations , Scanning tunneling microscopy , Misfit dislocations
Journal title :
Surface Science
Serial Year :
2012
Journal title :
Surface Science
Record number :
1687040
Link To Document :
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