Title of article :
Theoretical determination of two critical sizes for strain relaxation during Co/Pt(111) heteroepitaxy
Author/Authors :
Goyhenex، نويسنده , , C. and Tréglia، نويسنده , , G.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
11
From page :
272
To page :
282
Abstract :
By means of tight-binding quenched-molecular-dynamics simulations, we show that Co/Pt(111) growth involves two different relaxation lengths and mechanisms. First, below completion of the first monolayer, a lateral critical size appears for two-dimensional fcc and hcp quasi-pseudomorphic islands, which release their tensile stress by a dislocation lattice, allowing an over-closepacking of the film (as for 5d metal surface reconstructions). Then, for a thicker deposit, a vertical critical thickness of 2 ML is found, beyond which the whole Co film recovers its bulk lattice parameter, inducing a vertical height modulation. These results are successfully compared with most of the existing experimental data on this system.
Keywords :
Cobalt , Platinum , heteroepitaxy , Thin films , Molecular dynamics simulation , Strain relaxation
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1687641
Link To Document :
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