Title of article
Electronic and geometric structure of thin CoO(100) films studied by angle-resolved photoemission spectroscopy and Auger electron diffraction
Author/Authors
Heiler، نويسنده , , M. and Chassé، نويسنده , , A. and Schindler، نويسنده , , P.J. and Hollering، نويسنده , , M. and Neddermeyer، نويسنده , , H.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
5
From page
36
To page
40
Abstract
We have prepared ordered thin films of CoO by evaporating cobalt in an O2 atmosphere on to a heated (500 K) Ag(100) substrate. The geometric and electronic structure of the films was characterized by means of Auger electron diffraction (AED) and angle-resolved photoemission spectroscopy (ARUPS), respectively. The experimental AED results were compared with simulated data, which showed that the film grows in (100) orientation on the Ag(100) substrate. Synchrotron-radiation-induced photoemission investigations were performed in the photon energy range from 25 eV to 67 eV. The dispersion of the transitions was found to be similar to that of previous results on a single-crystal CoO(100) surface. The resonance behaviour of the photoemission lines in the valence-band region was investigated by constant-initial-state (CIS) spectroscopy. The implications of this behaviour for assignment of the photoemission lines to specific electronic transitions is discussed and compared with published theoretical models of the electronic structure.
Keywords
Angle resolved photoemission , Cobalt oxides , Auger electron diffraction
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1687763
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