Title of article :
Possibilities and limitations of synchrotron X-ray powder diffraction with double crystal and double multilayer monochromators for microscopic speciation studies
Author/Authors :
De Nolf، نويسنده , , Wout and Jaroszewicz، نويسنده , , Jakub and Terzano، نويسنده , , Roberto and Lind، نويسنده , , Ole Christian and Salbu، نويسنده , , Brit and Vekemans، نويسنده , , Bart and Janssens، نويسنده , , Koen and Falkenberg، نويسنده , , Gerald، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Abstract :
The performance of a combined microbeam X-ray fluorescence/X-ray powder diffraction (XRF/XRPD) measurement station at Hamburger Synchrotronstrahlungslabor (HASYLAB) Beamline L is discussed in comparison to that at European Synchrotron Radiation Facility (ESRF) ID18F/ID22. The angular resolution in the X-ray diffractograms is documented when different combinations of X-ray source, optics and X-ray diffraction detectors are employed. Typical angular resolution values in the range 0.3–0.5° are obtained at the bending magnet source when a ‘pink’ beam form of excitation is employed. A similar setup at European Synchrotron Radiation Facility beamlines ID18F and ID22 allows to reach angular resolution values of 0.1–0.15°. In order to document the possibilities and limitations for speciation of metals in environmental materials by means of Hamburger Synchrotronstrahlungslabor Beamline L X-ray fluorescence/X-ray powder diffraction setup, two case studies are discussed, one involved in the identification of the crystal phases in which heavy metals such as chromium, iron, barium and lead are present in polluted soils of an industrial site (Val Basento, Italy) and another involved in the speciation of uranium in depleted uranium particles (Ceja Mountains, Kosovo). In the former case, the angular resolution is sufficient to allow identification of most crystalline phases present while in the latter case, it is necessary to dispose of an angular resolution of ca. 0.2° to distinguish between different forms of oxidized uranium.
Keywords :
Multilayer optics , Scanning microscopy , X-ray powder diffraction , X-ray optics , Synchrotron sources
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy
Journal title :
Spectrochimica Acta Part B Atomic Spectroscopy