Title of article
Distribution of dangling bond pairs on partially hydrogen-terminated Si(100) surface observed by scanning tunneling microscopy
Author/Authors
Chen، نويسنده , , Ru-Ping and Lin، نويسنده , , Deng-Sung، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
5
From page
196
To page
200
Abstract
Hydrogen recombinative desorption from a Si2H2 monohydride dimer on the Si(100) surface regenerates a dangling bond (DB) pair on the dimer. In this paper, we investigated the spatial distribution of the regenerated DB pairs on the Si(100)-2×1:H and disilane-passivated Si(100) surface using elevated temperature scanning tunneling microscopy (HT-STM) in the temperature range between 590 and 622 K. Experimental results indicate that the ends of one-dimensional (1D) monohydride dimer islands are preferred sites for DB pairs and a repulsive interaction occurs between two neighboring DB pairs in the same dimer row.
Keywords
Surface electronic phenomena (work function , Surface states , Surface potential , etc.) , surface energy , thermal desorption , hydrogen atom , Scanning tunneling microscopy , Silicon
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1687905
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