Title of article :
An XPS study of the influence of impurity Cu on the electronic structure of SrS
Author/Authors :
Vdovenkova، نويسنده , , T. and Vdovenkov، نويسنده , , A. and Soininen، نويسنده , , E.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
5
From page :
529
To page :
533
Abstract :
In this work the influence of Cu on X-ray photoelectron Sr 3d and S 2p spectra for low Cu concentrations in SrS is studied. The Cu impurity in the SrS lattice is detected by SIMS and X-ray diffractometry. l analysis of the S 2p and Sr 3d spectra shows that the Cu impurity at concentrations less than the XPS sensitivity limit has its main influence on the S 2p doublets that correspond to sulphur in SrS and to elementary sulphur clusters. SrS doping by Cu with subsequent annealing is accompanied by a decrease in the sulphur clusters size and leads to downward band bending and/or n-doping of SrS.
Keywords :
Copper , Semiconducting films , Sulphur , X-ray photoelectron spectroscopy , Alkaline earth metals
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1688162
Link To Document :
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