Title of article
Spectroscopic fingerprints of a surface Mott–Hubbard insulator: the case of SiC(0001)
Author/Authors
Santoro، نويسنده , , G. and Scandolo، نويسنده , , S. and Tosatti، نويسنده , , E.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
5
From page
534
To page
538
Abstract
We discuss the spectroscopic fingerprints that a surface Mott–Hubbard insulator should show at the intra-atomic level. The test case considered is that of the Si-terminated SiC(0001)3×3 surface, which is known experimentally to be insulating. We argue that, owing to the Mott–Hubbard phenomenon, spin unpaired electrons in the Si adatom dangling bonds are expected to give rise to an Si 2p core level spectrum with a characteristic three-peaked structure, as seen experimentally. This structure results from the joint effect of intra-atomic exchange, spatial anisotropy, and spin–orbit coupling. Auger intensities are also discussed.
Keywords
silicon carbide , etc.) , Surface potential , Photoelectron emission , Surface electronic phenomena (work function , Auger electron spectroscopy , Surface states , Semi-empirical models and model calculations , Insulating surfaces
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1688166
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