• Title of article

    The Y–Si(111) interface formation studied by scanning tunneling microscopy

  • Author/Authors

    Polop، نويسنده , , J.L Sacedon، نويسنده , , J.L and Mart??n-Gago، نويسنده , , J.A، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    5
  • From page
    842
  • To page
    846
  • Abstract
    We have investigated the formation of the Y–Si(111) interface at room temperature by the scanning tunneling microscopy (STM) technique. The nucleation of the yttrium is localized to the inner part of every subunit cell of the (7×7) reconstruction. Thus, small silicide-like amorphous islands are formed by reaction of the yttrium atoms with the adatoms and dangling bonds of the rest atoms. By analyzing the voltage dependence of the STM images we have concluded that these nuclei present a semiconducting behavior. For coverages around one monolayer the nuclei coalesce, conferring a metallic character to the interface.
  • Keywords
    Growth , Silicon , surface structure , Metal–semiconductor interfaces , Scanning tunneling microscopy , and topography , morphology , Yttrium , Roughness , Crystalline–amorphous interfaces
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1688445