Title of article :
Growth of ultrathin nanostructured Ag films on Si(111) 7×7: a SPA-LEED study
Author/Authors :
Moresco، نويسنده , , F. and Rocca، نويسنده , , M. and Hildebrandt، نويسنده , , T. and Henzler، نويسنده , , M.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2000
Pages :
7
From page :
22
To page :
28
Abstract :
Ultrathin Ag films grown on Si(111) 7×7 at different temperatures have been studied by spot profile analysis of low energy electron diffraction (SPA-LEED). For a deposition temperature of 100 K the films consist of touching (111) oriented grains and are complete at a coverage of about 1 Ag monolayer. For deposition at room temperature, in contrast, the grains form separated islands. The grains show a rotational disorder of 6° and are atomically flat, as the rms height variations are only 10% of the atomic Ag interlayer spacing.
Keywords :
Low energy electron diffraction (LEED) , Silicon , Growth , silver , morphology , and topography , Roughness , surface structure
Journal title :
Surface Science
Serial Year :
2000
Journal title :
Surface Science
Record number :
1688778
Link To Document :
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