Title of article
Time-of-flight photoemission electron microscopy – a new way to chemical surface analysis
Author/Authors
Schِnhense، نويسنده , , G and Oelsner، نويسنده , , A and Schmidt، نويسنده , , O and Fecher، نويسنده , , G.H and Mergel، نويسنده , , O. Jagutzki، نويسنده , , C.R. and Schmidt-Bِcking، نويسنده , , H، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
8
From page
180
To page
187
Abstract
The time structure of synchrotron radiation at BESSY I (Berlin) was utilised to operate a photoemission electron microscope in the time-of-flight mode. The electrons that are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. Two ways of fast image detection have been explored, a fast gated intensified CCD camera (800 ps gate time) and a special counting electronics in combination with a 3D (x,y,t)-resolving delay line detector (time resolution<500 ps). The latter device has a lateral resolution of about 50 μm in the image plane being equivalent to 1000 pixels along the image diagonal. An energy resolution of 400 meV has been achieved. The future potential of time-resolving photoemission microscopy is discussed.
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1689861
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