Title of article :
Scanning tunneling microscopy observation of Bi-induced surface structures on the Si(1 0 0) surface
Author/Authors :
Naitoh، نويسنده , , M. and Takei، نويسنده , , M. and Nishigaki، نويسنده , , S. and Oishi، نويسنده , , N. and Shoji، نويسنده , , F.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2001
Pages :
5
From page :
1440
To page :
1444
Abstract :
Formation of new surface structures induced by bismuth adsorbates at the Si(1 0 0) surface has been investigated by scanning tunneling microscopy. Bismuth atoms that adsorbed on the surface at 500°C, form long linear belts in the Si(1 0 0) topmost layer. Each belt consists of two chains of bismuth dimers and substitutes for four Si-dimers per Si-dimer row in the terrace. At higher coverages of bismuth (∼3 ML) at 450°C, long linear structures with an arrangement of bismuth chains similar to the belt on the Si terraces are formed in the bismuth terraces. When bismuth was deposited on the clean Si(1 0 0) surface at room temperature and the surface was sequentially annealed, deep pits were constructed in bismuth-covered terraces. This result is attributed to the strain in the bismuth films.
Keywords :
Surface relaxation and reconstruction , Surface stress , morphology , Bismuth , Silicon , Low index single crystal surfaces , Scanning tunneling microscopy , Roughness , and topography , surface structure
Journal title :
Surface Science
Serial Year :
2001
Journal title :
Surface Science
Record number :
1691408
Link To Document :
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