Title of article
Commensurate and incommensurate striped structure of Ag film growth on Si(1 1 1)3×3 surface at room temperature
Author/Authors
Oshima، نويسنده , , Yoshifumi and Nakade، نويسنده , , Hiroyuki and Shigeki، نويسنده , , Sinya and Hirayama، نويسنده , , Hiroyuki and Takayanagi، نويسنده , , Kunio، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2002
Pages
7
From page
307
To page
313
Abstract
Interface structure of silver (Ag) island grown on Si(1 1 1)3×3–Ag surface is analyzed by transmission electron microscopy and diffraction. Ag islands grow on the surface with several epitaxial orientations. Among Ag as-grown islands at room temperature, one with striped image contrast gives an interesting transmission electron diffraction (TED) spots which are commensurate and incommensurate with the 3×3 spots of the substrate surface. The interface structure analyzed by TED and electron microscope images is an Ag hexagonal lattice with Ag(0 1 2)hex plane parallel to the 3×3 surface. Structure of 3×3 periodicity remaining at the interface is discussed.
Keywords
Metal–semiconductor interfaces , Silicon , Transmission high-energy electron diffraction , Electron microscopy , growth , silver
Journal title
Surface Science
Serial Year
2002
Journal title
Surface Science
Record number
1691685
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