Title of article :
Structural analysis of Si(111)-√21 × √21-(Ag, Cs) surface by reflection high-energy positron diffraction
Author/Authors :
Fukaya، نويسنده , , Y. and Matsuda، نويسنده , , I. and Yukawa، نويسنده , , R. and Kawasuso، نويسنده , , A.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2012
Abstract :
We have investigated the Si(111)-√21 × √21-(Ag, Cs) superstructure using reflection high-energy positron diffraction. Rocking curve analysis based on the dynamical diffraction theory reveals that Cs atoms are located at a height of 3.04 Å above the underlying √3 × √3-Ag structure and that they form a triangular structure with a side length of 10.12 Å. The structure of the Si(111)-√21 × √21-(Ag, Cs) surface is significantly different from those of the Si(111)-√21 × √21-Ag and Si(111)-√21 × √21-(Ag, Au) surfaces, probably because of the different electronic structures of the alkali and noble metal atoms.
Keywords :
surface structure , cesium , Reflection high-energy positron diffraction (RHEPD) , silver , Silicon
Journal title :
Surface Science
Journal title :
Surface Science