Title of article :
Initial stages of Cu/Si interface formation
Author/Authors :
Savchenkov، نويسنده , , A. and Shukrinov، نويسنده , , P. and Mutombo، نويسنده , , Pingo and Slezلk، نويسنده , , J. and Chلb، نويسنده , , V.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2002
Abstract :
The adsorption of Cu atoms on the Si(1 1 1)-7×7 surface was studied by scanning tunnelling microscopy. The flash up to ∼550 °C stimulates a reaction leading to the massive re-arrangement of the surface resulting in the formation of 7×7 domains separated by disordered regions. Mostly, copper atoms are concentrated in these regions. Isolated Cu atoms were found incorporated in 7×7 reconstruction on the domains surface.
Keywords :
Copper , Surface chemical reaction , Scanning tunneling microscopy , surface segregation , Silicon
Journal title :
Surface Science
Journal title :
Surface Science