Title of article :
RHEED observation of BaTiO3 thin films grown by MBE
Author/Authors :
Yoneda، نويسنده , , Y. and Sakaue، نويسنده , , K. and Terauchi، نويسنده , , H.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Abstract :
Ferroelectric BaTiO3 thin films with a thickness of 10 monolayers (ML) were epitaxially grown on SrTiO3(0 0 1) substrates by very slow deposition using molecular beam epitaxy (MBE). The investigations were carried out by two growth methods: (i) codeposition and (ii) alternate deposition of the metal elements in an oxygen atmosphere. In situ observation of reflection high-energy electron diffraction confirmed that an epitaxial cube-on-cube structure was prepared. After the deposition, X-ray diffraction measurements were carried out. The 10-ML-thick BaTiO3 films were highly c-axis oriented single crystals with good film quality.
Keywords :
Reflection high-energy electron diffraction (RHEED) , and reflection , Surface relaxation and reconstruction , Diffraction , morphology , Roughness , X-Ray scattering , surface structure , and topography , growth , Molecular Beam Epitaxy
Journal title :
Surface Science
Journal title :
Surface Science