Title of article
A spectroscopic study of CNx formation by the keV N2+ irradiation of highly oriented pyrolytic graphite surfaces
Author/Authors
Yang، نويسنده , , D.-Q. and Sacher، نويسنده , , E.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2003
Pages
14
From page
185
To page
198
Abstract
Amorphous carbon nitride (CNx) thin layer, formed by the keV N2+ irradiation of highly oriented pyrolytic graphite, has been investigated using X-ray photoelectron and raman spectroscopies, and time-of-flight secondary ion mass spectrometry. C1s X-ray photoelectron spectroscopy (XPS) peak separations indicate that C–N bonds form over and above the graphite fragmentation previously obtained on Ar+ irradiation. N1s XPS peak separations indicate three components. Their attributions, and the resultant CNx structure, are confirmed by angle-resolved XPS and TOF–SIMS analyses.
Keywords
X-ray photoelectron spectroscopy , Raman scattering spectroscopy , Graphite , Secondary ion mass spectroscopy , nitrides , Ion bombardment
Journal title
Surface Science
Serial Year
2003
Journal title
Surface Science
Record number
1695551
Link To Document