Author/Authors :
Kopycinska، نويسنده , , Malgorzata and Ziebert، نويسنده , , Carlos and Schmitt، نويسنده , , Heinz and Rabe، نويسنده , , Ute and Hirsekorn، نويسنده , , Sigrun and Arnold، نويسنده , , Walter، نويسنده ,
Abstract :
In this study the influence of the annealing conditions on the surface morphology and the elastic and piezoelectric properties of thin-film lead calcium titanate samples were investigated with enhanced atomic force microscopy techniques like tapping mode, atomic force acoustic microscopy and ultrasonic piezo-mode. The morphology of the thin-films can serve as an indicator of their properties, whether they are in an amorphous, polycrystalline and/or nanocrystalline state proving the imaging capability of dynamic force microscopy techniques.
Keywords :
atomic force microscopy , Amorphous thin films , piezoelectric effect , Polycrystalline thin films
