Title of article :
RT growth of acetonitrile and acrylonitrile on Si(0 0 1)-2 × 1 studied by XPS and LEED
Author/Authors :
Simeoni، نويسنده , , M. and Lozzi، نويسنده , , L. and Santucci، نويسنده , , S.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Pages :
8
From page :
55
To page :
62
Abstract :
In this work we show the adsorption of acetonitrile (CH3CN) and acrylonitrile (CH2CHCN) on Si(0 0 1)-2 × 1 at room temperature by increasing the molecular doses. Especially, by means of XPS and LEED data, we stress the action of these molecules on the silicon surface locating the dangling-bonds quasi-saturation within 10 L. The shortage of nitrogen XPS signal and some anomalies in carbon spectra point to an invading action from a traditional X-ray source (Al-Kα line) against chemisorbed molecules. In particular, we think that a long exposure to this radiation could break carbon–silicon bonds changing some adsorption geometries and making desorb molecular fragments.
Keywords :
Low energy electron diffraction (LEED) , X-ray photoelectron spectroscopy , Silicon , Chemisorption
Journal title :
Surface Science
Serial Year :
2003
Journal title :
Surface Science
Record number :
1696344
Link To Document :
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