Title of article :
25 nm resolution single molecular fluorescence imaging by scanning near-field optical/atomic force microscopy
Author/Authors :
Kim، نويسنده , , J.M. and Ohtani، نويسنده , , T. and Muramatsu، نويسنده , , H.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Pages :
8
From page :
273
To page :
280
Abstract :
High-resolution single molecular near-field fluorescence images were observed by scanning near-field optical/atomic force microscopy (SNOM/AFM). We modified the SNOM/AFM for both high-resolution fluorescence imaging and high-resolution topographic imaging. The imaged fluorophore, Alexa 532, is prepared with a poly-methyl-methacrylate (PMMA) film coating. A fluorescence resolution of 25 nm was obtained with a simultaneous topographic image of a flat surface. A sample prepared with a lower PMMA concentration exhibited a rough surface in the micro area. The results for the flat surface indicated that the fluorescence resolution is worst in the rough surface sample, that the maximum fluorescence intensities for the individual fluorophore are similar, and that the decay rate is faster. Thus, we concluded that the morphological effect is an important factor in fluorescence image resolution and the apparent lifetimes of the fluorescence molecules.
Keywords :
surface structure , Luminescence , morphology , Roughness , and topography , atomic force microscopy
Journal title :
Surface Science
Serial Year :
2004
Journal title :
Surface Science
Record number :
1696647
Link To Document :
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