Author/Authors :
Despont، نويسنده , , L. and Naumovi?، نويسنده , , D. and Clerc، نويسنده , , F. and Koitzsch، نويسنده , , C. and Garnier، نويسنده , , M.G. and Garcia de Abajo، نويسنده , , F.J. and Van Hove، نويسنده , , M.A. and Aebi، نويسنده , , P.، نويسنده ,
Abstract :
Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.
Keywords :
multiple scattering , Copper , Electron solid interaction , scattering , diffraction , Photoelectron diffraction
