Manipulation of organic “needles” using an STM operated under SEM control

Nano-sized P4P (para-quaterphenylene) organic crystallites grown on a gold substrate were removed and redeposited using the tip of an STM. The controlled lift-off of the needle-shaped crystallites was imaged by a simultaneously operated SEM. The forces exerted by the metal STM tip on the nano-crystal during this nano-manipulation process could be determined by monitoring the deflection of the STM tip. After the lift-off process the former contact area was imaged using the STM. These STM micrographs clearly demonstrate that the region between the needles is covered by a P4P layer with a thickness of at least 3 nm.