Author/Authors :
Kralj، نويسنده , , M. and Bailly، نويسنده , , A. and Saint-Lager، نويسنده , , M.-C. and Degen، نويسنده , , S. and Krupski، نويسنده , , A. and Becker، نويسنده , , C. and Dolle، نويسنده , , P. and De Santis، نويسنده , , M. and Wandelt، نويسنده , , K.، نويسنده ,
Abstract :
The morphology and the atomic scale structure of thin gold films (up to 2.5 ML) on Pd(1 1 0) were studied by means of scanning tunneling microscopy and surface X-ray diffraction. At room temperature the films exhibit a multilayer growth mode accompanied by the formation of highly anisotropic islands. Annealing above 500 K significantly increases the smoothness of the gold films, which are in registry with the substrate. Above a critical threshold of two monolayers a (1 × 2) missing-row reconstructed film is found. This reconstructed surface is well ordered after annealing at temperatures above 580 K. The specific gold film morphology is envisaged as a way to relax the strain caused by the mismatch between gold and palladium.
Keywords :
X-ray diffraction and scattering , surface reconstruction , Thin film structure and morphology , Gold , PALLADIUM , Scanning tunneling microscopy
