Growth of silver structures on silicon surfaces observed in vivo by scanning tunneling microscopy

Early stages of growth of silver thin films on oriented silicon surfaces Si(1 0 0)2 × 1 and Si(1 1 1)7 × 7 were studied directly during deposition at room temperature by the scanning tunneling microscopy. Single Ag atoms deposited on the Si(1 0 0)2 × 1 surface diffuse too fast on the surface to be imaged by the microscope. Nucleation on C-type defects of the Si(1 0 0)2 × 1 reconstruction has been observed. During further growth, the defects represent stable terminations of silver chains. Ag nanoclusters growing on the Si(1 1 1)7 × 7 surface have been studied as a system with low diffusivity at room temperature. On this surface, presence of effective interaction between Ag clusters and individual Ag atoms in neighboring cells of the reconstruction has been identified. The interaction results in lowering the barrier for Ag atom hopping to an adjacent unit cell occupied by an Ag cluster. Unique possibilities arising from scanning the surface directly during growth are demonstrated.