Title of article :
Comment on “Photoelectron spectroscopy study of Ga1−xMnxAs(0 0 1) surface oxide and low temperature cleaning” by S.A. Hatfield et al. [Surf. Sci. 585 (2005) 66]
Author/Authors :
Iwanowski، نويسنده , , R.J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2006
Pages :
2
From page :
4670
To page :
4671
Abstract :
Attempts have been made recently to reveal surface–bulk core-level splitting in graphite using high resolution synchrotron radiation or X-ray photoelectron spectra. However, the different author descriptions of the carbon 1s line-shape in terms of two Doniach–Sunjic (DS) components still show discrepancies. In this work, we present high resolution, high quality carbon 1s X-ray photoelectron spectra and peak fitting results, and compare them with previous works. The relative intensity of the bulk and surface components varied with changes to the photoelectron takeoff angle. Here, we interpret carbon 1s line-shape in highly oriented pyrolytic and disordered polycrystalline graphite, taking into account perturbations to the pure DS line-shape and the effect of tilt on the binding energies of the two components. The results explain the apparent disagreement among published works.
Keywords :
X-ray photoelectron spectroscopy , Gallium manganese arsenide , Manganese , Semiconducting surfaces , Single crystal epitaxy
Journal title :
Surface Science
Serial Year :
2006
Journal title :
Surface Science
Record number :
1699763
Link To Document :
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