• Title of article

    Spirals on Si(1 1 1) at sublimation and growth: REM and LODREM observations

  • Author/Authors

    Ranguelov، نويسنده , , B. and Métois، نويسنده , , J.J and Müller، نويسنده , , P.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2006
  • Pages
    7
  • From page
    4848
  • To page
    4854
  • Abstract
    Using recently proposed improvements of reflection electron microsopy (REM) we study, in perfectly controlled thermodynamics conditions, spiral and spirals shapes on Si(1 1 1) surface. It is shown that the new method named low distortion reflection electron microscopy (LODREM) is a powerful instrument, resolving in much more details (compared with REM) growth or evaporation spirals at the crystal surface. More precisely, we examine the distance between two successive steps of a spiral at growth (or evaporation) with respect to the supersaturation (or undersaturation). It is found that this distance scales with an exponent close to −1/2. This result, which deviates from the BCF theory, originates from a non-local behavior with a slow kinetic of attachment of the adatoms at the steps.
  • Keywords
    Reflection electron microscopy , Low distortion reflection electron microscopy , Silicon surfaces , Growth or evaporation spiral
  • Journal title
    Surface Science
  • Serial Year
    2006
  • Journal title
    Surface Science
  • Record number

    1699831