Title of article
Spirals on Si(1 1 1) at sublimation and growth: REM and LODREM observations
Author/Authors
Ranguelov، نويسنده , , B. and Métois، نويسنده , , J.J and Müller، نويسنده , , P.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2006
Pages
7
From page
4848
To page
4854
Abstract
Using recently proposed improvements of reflection electron microsopy (REM) we study, in perfectly controlled thermodynamics conditions, spiral and spirals shapes on Si(1 1 1) surface. It is shown that the new method named low distortion reflection electron microscopy (LODREM) is a powerful instrument, resolving in much more details (compared with REM) growth or evaporation spirals at the crystal surface. More precisely, we examine the distance between two successive steps of a spiral at growth (or evaporation) with respect to the supersaturation (or undersaturation). It is found that this distance scales with an exponent close to −1/2. This result, which deviates from the BCF theory, originates from a non-local behavior with a slow kinetic of attachment of the adatoms at the steps.
Keywords
Reflection electron microscopy , Low distortion reflection electron microscopy , Silicon surfaces , Growth or evaporation spiral
Journal title
Surface Science
Serial Year
2006
Journal title
Surface Science
Record number
1699831
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