Title of article :
Au-induced nanofaceting and the stoichiometry of the Si(7 7 5)–Au surface
Author/Authors :
Claude Pédri، نويسنده , , L.J. and Toppozini، نويسنده , , James L. and Gallagher، نويسنده , , M.C.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2007
Abstract :
The Au-induced changes in the surface morphology of a Si(1 1 1) sample miscut 8° towards [ 1 1 2 ¯ ] have been measured using room temperature scanning tunneling microscopy and low energy electron diffraction. Au coverages of less than 0.06 ML up to 0.43 ML have been investigated. In all cases Au adsorption produces dramatic changes in surface morphology. The Au-induced surface exhibits nanofacets with orientations that depend critically on the amount of Au deposited. Below 0.32 ML, the restructured surface always includes (7 7 5)-Au nanofacets suggesting that the (7 7 5)-Au facet is energetically preferred on this surface. The (7 7 5)-Au facet is oriented 8.5° from [1 1 1] towards [ 1 1 2 ¯ ] and is characterized by 1-d chains spaced 21.3 إ apart that run along the [ 1 1 ¯ 0 ] direction. By maximizing the surface area of the (7 7 5) facets and optimizing the associated diffraction pattern we determine that the (7 7 5)-Au reconstruction is optimized at 0.24 ML and corresponds to a stoichiometry of 1.5 Au atoms per 1 × 1 unit cell. We believe that the local Au coverage on the (7 7 5) facet is 0.24 ML, and that the deficit/extra of Au at any particular coverage is accommodated by non-(7 7 5) facets. For example at 0.06 ML the regions of step bunching observed on the clean surface are eliminated and Au-induced (7 7 5) and Au-free (1 1 1)7 × 7 facets are already visible. Up to 0.18 ML the non-(7 7 5) facet is Au free. Beyond 0.32 ML, the (7 7 5)-Au reconstruction is no longer stable and the extra Au is accommodated by the formation of higher angle facets with smaller chain spacings.
Keywords :
Steps , Nanostructures , Scanning tunneling microscopy , Faceting , Nanopatterning , surface structure , Step formation and bunching , morphology , and topography , Roughness , Silicon
Journal title :
Surface Science
Journal title :
Surface Science