Reaction of acetonitrile with the silicon(0 0 1) surface: A combined XPS and FTIR study

The adsorption of acetonitrile on the Si(0 0 1) surface has been investigated using X-ray photoelectron spectroscopy (XPS) and Fourier-transform infrared spectroscopy (FTIR). XPS and FTIR spectra indicate that adsorbed acetonitrile forms two correlated binding configurations, a CN species with a strong FTIR absorption at 1540 cm−1 and a CCN (ketenimine) species that has a very strong FTIR absorption at 1952 cm−1. The CCN FTIR peak at 1952 cm−1 shows a striking polarization dependence, with the infrared transition dipole almost entirely in the plane of the sample and parallel to the SiSi dimer axis. Our data suggests that the primary CCN structure results from cleavage of two C–H bonds, forming a structure in which the N and terminal C atom are both linked to the surface. Temperature-dependent experiments help to elucidate the complicated reaction mechanism for acetonitrile adsorbing onto the Si(0 0 1) surface. Dosing at higher temperature increases the amount of CCN relative to CN species while heating leads to direct transformation of the CN to the CCN species. Our results indicate that previous studies, which considered only products formed by cleavage of a single C–H bond, have misidentified the primary ketenimine product. A reinterpretation of the earlier results, combined with data presented here, sheds new light onto the products and mechanism of interaction of acetonitrile with Si(0 0 1).